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Measuring CADeT Performance by Means of FITTest_BENCH06 Benchmark Circuits

In: Computing and Informatics, vol. 27, no. 6
J. Strnadel - T. Pečenka - Z. Kotásek

Details:

Year, pages: 2008, 913 - 930
Keywords:
Benchmark, design for testability, regisdter-transfer level, test point insertion, scan design technique
About article:
Benchmark circuits provide a basis for both research institutions and industry to measure their methods and products against. This paper focuses on utilization of recently published FITTest_BENCH06 benchmarks for measuring quality of our novel academic design for testability tool called CADeT. The paper presents basic characteristics of benchmarks and CADeT tool, provides results and analysis of implementing individual testing techniques and their constraint-driven combination to particular benchmarks.
How to cite:
ISO 690:
Strnadel, J., Pečenka, T., Kotásek, Z. 2008. Measuring CADeT Performance by Means of FITTest_BENCH06 Benchmark Circuits. In Computing and Informatics, vol. 27, no.6, pp. 913-930. 1335-9150.

APA:
Strnadel, J., Pečenka, T., Kotásek, Z. (2008). Measuring CADeT Performance by Means of FITTest_BENCH06 Benchmark Circuits. Computing and Informatics, 27(6), 913-930. 1335-9150.