Institute of Measurement Science
Topic
Development of on-chip measurements of transient characteristics of semiconductor devices
PhD. program
Measurement Technology
Name of the supervisor
Prof. Ing. Alexander Šatka, CSc.
Contact:
Receiving school
The Faculty of Electrical Engineering and Information Technology
Annotation
The goal of the thesis is to develop and apply measurement methods for determination of transient electrical and opto-electrical characteristics of semiconductor switching devices and determination of their switching parameters. Envisaged is mostly the development of the electrical and opto-electrical time domain pulse reflectometry for measurement of input and output characteristics of Si and GaN semiconductor switching devices and logic circuits integrated on chip as well as extraction of their parameters. PhD student interested in the theme should have knowledge about properties of electronic devices, the theory of electrical measurements and computer analysis of electronic circuits, to the extent of technology and natural sciences university study programs. A good knowledge of technical English is mandatory. PhD student will gather a wide spectrum of new knowledge and practical experience in design and realization of electronic and opto-electronic measurements of switching electronic devices.