Institute of Measurement Science
Topic
Measurement of geometrical quantities in 3D objects by application of X-ray microtomography
PhD. program
Measurement Technology
Name of the supervisor
RNDr. Miroslav Hain, PhD.
Contact:
Receiving school
The Faculty of Electrical Engineering and Information Technology
Annotation
The topic of the dissertation is the development of contactless microtomographic methods for measurement of geometric quantities in 3D objects using X-ray microtomography. The PhD student should deal with methods of measurement, analysis, evaluation of object dimensions and porosity of materials, dimensional analysis of the inner structure of composite materials. The aim of the thesis is to develop precise microtomographic methods for measuring geometrical quantities, designing etalons and methods of microtomographic measurement system calibration and analyzing measurement uncertainties.
Requirements for applicants are knowledge of professional English, knowledge of contactless methods of measurement and analysis of measurement uncertainties. The advantage is also the knowledge of programming (C, Matlab) and experience with design and construction of electronic circuits. During his / her studies, the PhD student will be acquainted with the activities and operation of the X-ray microtomograph, he / she will extend his / her knowledge in the field of imaging measuring methods and their use in material research.
Requirements for applicants are knowledge of professional English, knowledge of contactless methods of measurement and analysis of measurement uncertainties. The advantage is also the knowledge of programming (C, Matlab) and experience with design and construction of electronic circuits. During his / her studies, the PhD student will be acquainted with the activities and operation of the X-ray microtomograph, he / she will extend his / her knowledge in the field of imaging measuring methods and their use in material research.