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Research Infrastructure of SAS (RI SAS)

Measurements, analysis & technology / Physical / Chemical

Controlled polymerization

Encapsulation / microcapsules development

Gel permeation chromatography

HPLC / UHPLC / ultra chromatography

Chromatography / gas / liquids / ion

Liquids and melts Rheology

Organic analysis (total organic C, biomass)

Physical and mechanical properties measurement of the solids / materials and constructions / Surface Preparation

Calorimetry

Defectoscopy / Porosimetry

Electric - conductivity, voltage, magnetism

Electrolysis and thermal sample preparing / modification

Electrophoresis / gel electrophoresis

Granulometry (morphology)

Indentation / nanoindentation

Ion deposition

Laser Dispersion measurement / extensometer

Measuring the distribution of nanoparticle / surface charge

Mineralogical and metallographic preparation

Profilometry

Respirometry - biological activity measurement

Surface feature analysis

The magnetic properties of substances measuring

Thin films Preparation and Application

Volumetric analysis / sorption analysis

Power X-ray tomography / Micro CT

Morphology, tomography - objects and materials

MRI tomography for thin layers

Pulsed laser polymerization

Spectrometry / Spectroscopy

Atomic Spectroscopy - emission / absorption AES / AAS

Cathodoluminescence (CL)

Fluorescence spectroscopy / WD

Chemiluminescence

ICP – CCD

Infrared spectroscopy / Fourier Transform Infrared Spectrometry FTIR

Laser Spectroscopy / Laser Induced Breakdown Spectrometer LEA

Mass spectrometry - MS / stable isotopes tracer analysis / GC - MS

Mass spectrometry – ICP –MS

Nuclear magnetic resonance spectroscopy NMR

Protein mass spectrometry

Raman spectrometry

Spectrophotometry / Small volume / nano spectrophotometry

SpectroPolarimetry

Ultraviolet Imaging Spectroscopy / Spectrograph - UVIS

Thermic methods / analysis

TGA / DTA, differential calorimetry (DSC)

Thermomechanical / dynamic mechanical analysis TMA-DMA

X-ray methods

Electron diffraction

Phase structure analysis

X-ray diffraction

XRF microscopy, surface mapping