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Research Infrastructure of SAS (RI SAS)

Microscopy and Microanalysis


Electron backscatter diffraction – EBSD

Electron Probe Microanalysis – Field Emission (FEG EPMA)

Energy Dispersive method– EDS

Wavelength Dispersive method - WDS


AFM - Atomic Force Microscopy

Confocal microscopy

Fluorescence inverted microscope

Focus Ion Beam FIB

Optical / polarized

Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM) – (Low vacuum / High vacuum; LV/HV)

Scanning Electron Microscopy (SEM) – Field Emission (FEG)

Transmission microscopy TEM / HRTEM / S-TEM