|

|
|
|
|
|
Multifunctional Nanomaterials Characterization Exploiting
EllipsoMetry and
Polarimetry
|
|

|
|
|
|
|
|
|
NanoCharM Newsletter - Issue 4
|
|
|
The NanoCharM newsletter is the newsletter for scientists,
companies and organizations involved in the field of nanomaterials
synthesis, characterization and production.
In This Issue
The
Nanomaterial characterization bottleneck
Follow
the light: Ellipsometry and Polarimetry
Characterization
of solar cells by Spectroscopic Ellipsometry
What
can Raman Spectroscopy and Spectroscopic Ellipsometry bring to
characterization of material surfaces and
thin films?
Gallium
nanoparticles by Spectroscopic Ellipsometry and Raman Spectroscopy
Dissemination
Activities
NIM-NIL:
Large Area Fabrication of 3D Negative Refractive Index Materials by
Nanoimprint Lithography
Group
Profile: Ecole Polytechnique-CNRS, Palaiseau France
Forthcoming
Events: The 5th International Conference on Spectroscopic Ellipsometry
The
3rd Nano-CharM winter School
|
|
Special Points Of Interest
To
reap the benefits of nanotechnology, improvements in characterization
are needed to increase throughput
as creativity outpaces our ability to confirm
results. The considerations of research, commerce, and regulation are
part of a larger feedback loop that
illustrates a mutual need for rapid, easy, and standardized
characterization
of a large property matrix. Now, we have
an opportunity and a need to strike a new balance that drives higher
quality research, simplifies commercial
exploitation, and allows reasoned regulatory approaches
|
|
|
Read the
Newsletter (PDF) >>
|
|
|
|
3rd NanoCharM (Winter) School on Ellipsometry
27th February - 5th March 2010 - Bad Hofgastein,
Salzburg, Austria
|
|

|
The winter school is the 3rd school in the frame
of the EU Project NanoCharM. The lectures are separated into basic
and advanced levels. A special focus will be set on plasmons and
negative refraction structures.
Who may benefit? - The school is aimed at
students, researchers and SMEs interested of any level and
knowledge of ellipsometry. It helps in understanding the properties
of nanomaterials, nanodevices and related processes through the use
of polarimetry and ellipsometry techniques.
No registration fee
|
|
|
Read more...
|
|
|
|
If you would like to be kept
informed with the latest updates, register your brief details at the
NanoCharM website:
Register
>>
|
|
|
|
|
|
|
|

|
|

|
"Shining the light of ellipsometry to the nanoworld"
|

|
|

|
|