Research Infrastructure of SAS (RI SAS)

Microscopy and Microanalysis

Microanalysis

Electron backscatter diffraction – EBSD
Electron Probe Microanalysis – Field Emission (FEG EPMA)
Energy Dispersive method– EDS
Wavelength Dispersive method - WDS

Microscopy

AFM - Atomic Force Microscopy
Confocal microscopy
Fluorescence inverted microscope
Focus Ion Beam FIB
Optical / polarized
Scanning Electron Microscopy (SEM)
Scanning Electron Microscopy (SEM) – (Low vacuum / High vacuum; LV/HV)
Scanning Electron Microscopy (SEM) – Field Emission (FEG)
Transmission microscopy TEM / HRTEM / S-TEM